Deterministic BIST with multiple scan chains
نویسندگان
چکیده
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a pattern generator which stimulates all scan chains simultaneously and guarantees complete fault coverage. The new scheme may require less chip area than a classical LFSR-based approach while better or even complete fault coverage is obtained at the same time.
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ورودعنوان ژورنال:
- J. Electronic Testing
دوره 14 شماره
صفحات -
تاریخ انتشار 1998